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Interconnect Robustness Depends on Scaling for Reliability Analysis
By Matthew Hogan, Product Marketing Manager, Calibre Design Solutions, Mentor Graphics The safety net of design margins that were once available to designers has disappeared. Whether you’re...
View ArticleReliability Scoring for the Automotive Market
By Jeff Wilson, DFM Product Marketing Manager, Calibre, Mentor Graphics Introduction The annual growth for car sales is typically in the single digits, but the electronic content inside those cars is...
View ArticleLeveraging Reliability-Focused Foundry Rule Decks
By Matthew Hogan, Product Marketing Manager, Calibre Design Solutions, Mentor Graphics Not that long ago, all designers had for integrated circuit (IC) reliability verification was a plethora of...
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Established Technology Nodes: The Most Popular Kid at the Dance
By Michael White, Mentor Graphics I remember back in the day at high school dances, always wanting to dance with the most popular girl in school. I never could, because there were a constant stream of...
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Context-Aware Latch-up Checking
By Matthew Hogan, Product Marketing Manager, Calibre Design Solutions, Mentor Graphics Latch-up in CMOS circuits is a long-studied and troubling phenomenon that often leads to chip failure through the...
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How Critical Area Analysis Optimizes Memory Redundancy Design
By Simon Favre, Mentor Graphics Introduction As any design engineer knows, the farther downstream a design goes, the less likely a manufacturing problem can be corrected without a costly and...
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Latch-Up Detection: How to Find an Invisible Fault
By Matthew Hogan Way back when, in the olden days (which, in the semiconductor industry, usually means last week), designers used visual inspections and manual calculations to check their layouts. The...
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Faster Signoff and Lower Risk with Chip Polishing
By Bill Graupp, Mentor, a Siemens Business Designing integrated circuits (ICs) today is a complex and high-risk endeavor; design teams are large and often scattered around the world, tool flows are...
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Reliability for the Real (New) World
By Dina Medhat There’s nothing more annoying than a device that doesn’t perform as expected. Nearly everyone has experienced the ultimate frustration of the “intermittent failure” problem with their...
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How to Build CMP Models for Hotspot Detection
By Ruben Ghulghazaryan, Jeff Wilson Mentor, a Siemens Business Over the last two decades, chemical mechanical polishing (CMP) has become a mainstay in the IC manufacturing process. Foundries employ it...
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